Measurement Science Review's Cover Image
Open Access

Measurement Science Review

Volume 21 (2021): Issue 4 (August 2021)

Download Cover
Previous Issue
Next Issue
4 Articles
Open Access | Aug 13, 2021
A Method for Improving the Accuracy of Natural Frequency Measurement Using In-the-loop Computing
Adam Kotowski

Adam Kotowski

Faculty of Electrical Engineering, Bialystok University of TechnologyBialystok, Poland
Search for this author on
Sciendo|Google Scholar
Kotowski, Adam
  
Open Access | Aug 13, 2021
Analytical Model of an I-core Coil for Nondestructive Evaluation of a Conducting Cylinder below an Infinite Plane Conductor
Siquan Zhang

Siquan Zhang

Department of Electrical and Automation, Shanghai Maritime UniversityShanghai, China
Search for this author on
Sciendo|Google Scholar
Zhang, Siquan
  
Open Access | Aug 13, 2021
True Cause for Multi-Layer Inductive Coils’ Sensitivity to Ambient Relative Humidity
Ling-Xiang Liu

Ling-Xiang Liu

Retired from National Metrology Centre of Singapore since Nov. 2008Berlin, Germany
Search for this author on
Sciendo|Google Scholar
Liu, Ling-Xiang
 and 
Zhong-Tai Qian

Zhong-Tai Qian

Retired from National Institute of MetrologyBeijing, China
Search for this author on
Sciendo|Google Scholar
Qian, Zhong-Tai
  
Open Access | Aug 13, 2021
Epileptic Seizure Detection using Deep Ensemble Network with Empirical Wavelet Transform
Sreelekha Panda

Sreelekha Panda

Dept. Of ECE, Centurion University of Technology and ManagementIndia
Search for this author on
Sciendo|Google Scholar
Panda, Sreelekha
, 
Abhishek Das

Abhishek Das

Dept. Of ECE, ITER, Siksha ‘O’ Anusandhan (Deemed to be University)Bhubaneswar, India
Search for this author on
Sciendo|Google Scholar
Das, Abhishek
, 
Satyasis Mishra

Satyasis Mishra

Dept. Of ECE, Centurion University of Technology and ManagementIndia
Search for this author on
Sciendo|Google Scholar
Mishra, Satyasis
 and 
Mihir Narayan Mohanty

Mihir Narayan Mohanty

Dept. Of ECE, ITER, Siksha ‘O’ Anusandhan (Deemed to be University)Bhubaneswar, India
Search for this author on
Sciendo|Google Scholar
Mohanty, Mihir Narayan
  

Search

All Volumes and Issues in this Journal

Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing
Journal RSS Feed