Application of Machine Vision Technology in Defect Detection of High Performance Phase Noise Measurement Chips

Data publikacji: 03 wrz 2024

Otrzymano: 30 kwi 2024

Przyjęty: 01 sie 2024

DOI: https://doi.org/10.2478/amns-2024-2412

Słowa kluczowe

Mean value filtering algorithm, Sobel operator, PCA method, Support vector machine, Chip defect detection

© 2024 Jianxun Deng et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.