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Application of Machine Vision Technology in Defect Detection of High Performance Phase Noise Measurement Chips

Jianxun Deng

Jianxun Deng

School of Architecture and Materials, Chongqing College of Electronic EngineeringChongqing, China
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Deng, Jianxun
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Chunxia Hu

Chunxia Hu

School of Artificial Intelligence and Big Data, Chongqing College of Electronic EngineeringChongqing, China
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Hu, Chunxia
  
Sep 03, 2024
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Published Online: Sep 03, 2024
Received: Apr 30, 2024
Accepted: Aug 01, 2024
DOI: https://doi.org/10.2478/amns-2024-2412
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© 2024 Jianxun Deng et al., published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Language:
English
Publication timeframe:
1 times per year
Journal Subjects:
Life Sciences, Life Sciences, other, Mathematics, Applied Mathematics, General Mathematics, Physics, Physics, other
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