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Journals
Foundations of Computing and Decision Sciences
Volume 49 (2024): Issue 3 (September 2024)
Open Access
CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
Jianhong Ma
Jianhong Ma
Zhengzhou University, Cyber Science and Engineering
ZhangZhou, China
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Ma, Jianhong
,
Tao Zhang
Tao Zhang
Zhengzhou University, Cyber Science and Engineering
ZhangZhou, China
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Zhang, Tao
,
Xiaoyan Ma
Xiaoyan Ma
Zhengzhou University, Cyber Science and Engineering
ZhangZhou, China
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Ma, Xiaoyan
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Hui Tian
Hui Tian
Zhengzhou University, Cyber Science and Engineering
ZhangZhou, China
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Tian, Hui
Sep 19, 2024
Foundations of Computing and Decision Sciences
Volume 49 (2024): Issue 3 (September 2024)
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Published Online:
Sep 19, 2024
Page range:
261 - 285
Received:
Sep 17, 2023
Accepted:
May 19, 2024
DOI:
https://doi.org/10.2478/fcds-2024-0014
Keywords
Surface defect detection on wafers
,
YOLOv7
,
coordinate attention
,
CAREVC
,
IDetect_Decoupled
© 2024 Jianhong Ma et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.