CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
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Sep 19, 2024
About this article
Published Online: Sep 19, 2024
Page range: 261 - 285
Received: Sep 17, 2023
Accepted: May 19, 2024
DOI: https://doi.org/10.2478/fcds-2024-0014
Keywords
© 2024 Jianhong Ma et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Ma, Jianhong
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Zhang, Tao
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Ma, Xiaoyan
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Tian, Hui
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China