Open Access

Application of Machine Vision Technology in Defect Detection of High Performance Phase Noise Measurement Chips

and

Sep 03, 2024

Application of Machine Vision Technology in Defect Detection of High Performance Phase Noise Measurement Chips's Cover Image

Applied Mathematics and Nonlinear Sciences

Volume 9 (2024): Issue 1 (January 2024)

About this article

Previous Article

Cite

Share

Download Cover

Published Online: Sep 03, 2024

Received: Apr 30, 2024

Accepted: Aug 01, 2024

DOI: https://doi.org/10.2478/amns-2024-2412

Keywords
Mean value filtering algorithm, Sobel operator, PCA method, Support vector machine, Chip defect detection

© 2024 Jianxun Deng et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.

Deng, Jianxun

School of Architecture and Materials, Chongqing College of Electronic EngineeringChongqing, China

Hu, Chunxia

School of Artificial Intelligence and Big Data, Chongqing College of Electronic EngineeringChongqing, China

Language:: English

Publication timeframe:: 1 times per year
Journal Subjects:: Life Sciences, Life Sciences, other, Mathematics, Applied Mathematics, General Mathematics, Physics, Physics, other

Journal RSS Feed