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Application of Machine Vision Technology in Defect Detection of High Performance Phase Noise Measurement Chips

Jianxun Deng

Jianxun Deng

School of Architecture and Materials, Chongqing College of Electronic EngineeringChongqing, China
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Deng, Jianxun
 e 
Chunxia Hu

Chunxia Hu

School of Artificial Intelligence and Big Data, Chongqing College of Electronic EngineeringChongqing, China
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Hu, Chunxia
  
03 set 2024
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Pubblicato online: 03 set 2024
Ricevuto: 30 apr 2024
Accettato: 01 ago 2024
DOI: https://doi.org/10.2478/amns-2024-2412
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© 2024 Jianxun Deng et al., published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Deng, Jianxun
School of Architecture and Materials, Chongqing College of Electronic EngineeringChongqing, China
Hu, Chunxia
School of Artificial Intelligence and Big Data, Chongqing College of Electronic EngineeringChongqing, China
Lingua:
Inglese
Frequenza di pubblicazione:
1 volte all'anno
Argomenti della rivista:
Scienze biologiche, Scienze della vita, altro, Matematica, Matematica applicata, Matematica generale, Fisica, Fisica, altro
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