Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Kategoria artykułu: Research Article

Data publikacji: 28 wrz 2016

Zakres stron: 676 - 683

Otrzymano: 22 lut 2016

Przyjęty: 09 lip 2016

DOI: https://doi.org/10.1515/msp-2016-0086

Słowa kluczowe

copper phthalocyanine, Raman spectroscopy, molecular orientation, atomic force microscopy, heat treatment

© 2016 R. Skonieczny et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.