Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Categoría del artículo: Research Article

Publicado en línea: 28 sept 2016

Páginas: 676 - 683

Recibido: 22 feb 2016

Aceptado: 09 jul 2016

DOI: https://doi.org/10.1515/msp-2016-0086

Palabras clave

copper phthalocyanine, Raman spectroscopy, molecular orientation, atomic force microscopy, heat treatment

© 2016 R. Skonieczny et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.