Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Catégorie d'article: Research Article

Publié en ligne: 28 sept. 2016

Pages: 676 - 683

Reçu: 22 févr. 2016

Accepté: 09 juil. 2016

DOI: https://doi.org/10.1515/msp-2016-0086

Mots clés

copper phthalocyanine, Raman spectroscopy, molecular orientation, atomic force microscopy, heat treatment

© 2016 R. Skonieczny et al., published by Sciendo

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