Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Categoria dell'articolo: Research Article

Pubblicato online: 28 set 2016

Pagine: 676 - 683

Ricevuto: 22 feb 2016

Accettato: 09 lug 2016

DOI: https://doi.org/10.1515/msp-2016-0086

Parole chiave

copper phthalocyanine, Raman spectroscopy, molecular orientation, atomic force microscopy, heat treatment

© 2016 R. Skonieczny et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.