Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate

Article Category: Research Article

Published Online: Sep 28, 2016

Page range: 676 - 683

Received: Feb 22, 2016

Accepted: Jul 09, 2016

DOI: https://doi.org/10.1515/msp-2016-0086

Keywords

copper phthalocyanine, Raman spectroscopy, molecular orientation, atomic force microscopy, heat treatment

© 2016 R. Skonieczny et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.