Open Access

Research On Chips’ Defect Extraction Based On Image-Matching

Daode Zhang

Daode Zhang

School of Mechanical Engineering, Hubei University of TechnologyWuhan, China
Search for this author on
Sciendo|Google Scholar
Zhang, Daode
, 
Yangliu Xue

Yangliu Xue

School of Mechanical Engineering, Hubei University of TechnologyWuhan, China
Search for this author on
Sciendo|Google Scholar
Xue, Yangliu
, 
Xuhui Ye

Xuhui Ye

School of Mechanical Engineering, Hubei University of TechnologyWuhan, China
Search for this author on
Sciendo|Google Scholar
Ye, Xuhui
 and 
Yanli Li

Yanli Li

School of Mechanical Engineering, Hubei University of TechnologyWuhan, China
Search for this author on
Sciendo|Google Scholar
Li, Yanli
  
Mar 10, 2014
Research On Chips’ Defect Extraction Based On Image-Matching's Cover Image
About this article
Previous Article
Next Article
Cite
Download Cover
Published Online: Mar 10, 2014
Page range: 321 - 336
Received: Jul 20, 2013
Accepted: Feb 12, 2014
DOI: https://doi.org/10.21307/ijssis-2017-658
Keywords
© 2014 Daode Zhang et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Language:
English
Publication timeframe:
1 times per year
Journal Subjects:
Engineering, Introductions and Overviews, Engineering, other
Journal RSS Feed