Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Data publikacji: 19 gru 2016

Zakres stron: 828 - 833

Otrzymano: 16 kwi 2016

Przyjęty: 17 paź 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Słowa kluczowe

thin films, optical constants, ellipsometry, CdZnSe, optical band gap

© Wroclaw University of Technology

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