Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Published Online: Dec 19, 2016

Page range: 828 - 833

Received: Apr 16, 2016

Accepted: Oct 17, 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Keywords

thin films, optical constants, ellipsometry, CdZnSe, optical band gap

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