Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Publié en ligne: 19 déc. 2016

Pages: 828 - 833

Reçu: 16 avr. 2016

Accepté: 17 oct. 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Mots clés

thin films, optical constants, ellipsometry, CdZnSe, optical band gap

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