Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique
, , , , oraz
19 gru 2016
O artykule
Data publikacji: 19 gru 2016
Zakres stron: 828 - 833
Otrzymano: 16 kwi 2016
Przyjęty: 17 paź 2016
DOI: https://doi.org/10.1515/msp-2016-0118
Słowa kluczowe
© Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.




Optical band gap and dispersion parameters for investigated thin films_
Composition | Eg (eV) | Eg (eV) | Eo (eV) | Eo (eV) | Ed (eV) | Ed (eV) | Thickness (nm) | Thickness (nm) |
---|---|---|---|---|---|---|---|---|
as dep | annealed | as dep | annealed | annealed | annealed | as dep | annealed | |
CdSe | 1.69 | 1.65 | 3.42 | 3.19 | 19.37 | 18.78 | 180 | 177 |
Cd:60Zn:40Se | 2.1 | 2 | 4.07 | 3.96 | 20.87 | 20.88 | 158 | 154 |
ZnSe | 2.57 | 2.5 | 4.85 | 4.58 | 22.67 | 22.47 | 190 | 179 |