Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Pubblicato online: 19 dic 2016

Pagine: 828 - 833

Ricevuto: 16 apr 2016

Accettato: 17 ott 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Parole chiave

thin films, optical constants, ellipsometry, CdZnSe, optical band gap

© Wroclaw University of Technology

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