Investigation of structural, optical and electrical properties of (Ti,Nb)Ox thin films deposited by high energy reactive magnetron sputtering
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Oct 17, 2014
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Published Online: Oct 17, 2014
Page range: 457 - 464
DOI: https://doi.org/10.2478/s13536-013-0195-4
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© 2014 Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Mazur, Michal
Kaczmarek, Danuta
Prociow, Eugeniusz
Domaradzki, Jaroslaw
Wojcieszak, Damian
Bocheński, Jakub