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An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Erhan Tiryaki

Erhan Tiryaki

Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
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Tiryaki, Erhan
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Özlem Kocahan

Özlem Kocahan

Department of Physics, Faculty of Arts and Sciences, Namik Kemal UniversityTekirdag, Turkey
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Kocahan, Özlem
 and 
Serhat Özder

Serhat Özder

Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
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Özder, Serhat
  
May 21, 2021
An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet's Cover Image
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Published Online: May 21, 2021
Page range: 61 - 66
Received: Mar 23, 2021
Accepted: May 03, 2021
DOI: https://doi.org/10.2478/msr-2021-0009
Keywords
© 2021 Erhan Tiryaki et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing
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