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Measurement Science Review
Volume 21 (2021): Issue 2 (April 2021)
Open Access
An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
Erhan Tiryaki
Erhan Tiryaki
,
Özlem Kocahan
Özlem Kocahan
and
Serhat Özder
Serhat Özder
| May 21, 2021
Measurement Science Review
Volume 21 (2021): Issue 2 (April 2021)
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Published Online:
May 21, 2021
Page range:
61 - 66
Received:
Mar 23, 2021
Accepted:
May 03, 2021
DOI:
https://doi.org/10.2478/msr-2021-0009
Keywords
Dielectric film
,
refractive index
,
reflectance spectrum
,
continuous wavelet transform
,
generalized Morse wavelet
© 2021 Erhan Tiryaki et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.