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Investigation, analysis and comparison of current-voltage characteristics for Au/Ni/GaN Schottky structure using I-V-T simulation

A. Sadoun

A. Sadoun

Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
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Sadoun, A.
, 
S. Mansouri

S. Mansouri

Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
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Mansouri, S.
, 
M. Chellali

M. Chellali

Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
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Chellali, M.
, 
N. Lakhdar

N. Lakhdar

University of El Oued, Fac. Technology, Department of electrical engineeringEl Oued, Algeria
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Lakhdar, N.
, 
A. Hima

A. Hima

University of El Oued, Fac. Technology, Department of electrical engineeringEl Oued, Algeria
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Hima, A.
 and 
Z. Benamara

Z. Benamara

Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
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Benamara, Z.
  
Oct 18, 2019
Investigation, analysis and comparison of current-voltage characteristics for Au/Ni/GaN Schottky structure using I-V-T simulation's Cover Image
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Published Online: Oct 18, 2019
Page range: 496 - 502
Received: Jan 05, 2019
Accepted: Apr 25, 2019
DOI: https://doi.org/10.2478/msp-2019-0041
Keywords
© 2019 A. Sadoun et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Sadoun, A.
Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
Mansouri, S.
Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
Chellali, M.
Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
Lakhdar, N.
University of El Oued, Fac. Technology, Department of electrical engineeringEl Oued, Algeria
Hima, A.
University of El Oued, Fac. Technology, Department of electrical engineeringEl Oued, Algeria
Benamara, Z.
Laboratoire de Micro-Electronique Appliquée, Université Djillali Liables de Sidi Bel AbbesSidi Bel Abbes, Algeria
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties
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