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Journals
Materials Science-Poland
Volume 36 (2018): Issue 4 (December 2018)
Open Access
Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations
Tomasz Kotwica
Tomasz Kotwica
,
Jaroslaw Domaradzki
Jaroslaw Domaradzki
,
Damian Wojcieszak
Damian Wojcieszak
,
Andrzej Sikora
Andrzej Sikora
,
Malgorzata Kot
Malgorzata Kot
and
Dieter Schmeisser
Dieter Schmeisser
| Feb 01, 2019
Materials Science-Poland
Volume 36 (2018): Issue 4 (December 2018)
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Published Online:
Feb 01, 2019
Page range:
761 - 768
Received:
Nov 09, 2018
Accepted:
Nov 30, 2018
DOI:
https://doi.org/10.2478/msp-2018-0100
Keywords
surface
,
gradient distribution
,
thin film oxide
© 2018 Tomasz Kotwica et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Tomasz Kotwica
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and Technology
Wroclaw, Poland
Jaroslaw Domaradzki
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and Technology
Wroclaw, Poland
Damian Wojcieszak
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and Technology
Wroclaw, Poland
Andrzej Sikora
Department of Material Science and Diagnostics, Electrotechnical Institute,
Wroclaw, Poland
Malgorzata Kot
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-Senftenberg
Cottbus, Germany
Dieter Schmeisser
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-Senftenberg
Cottbus, Germany