Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Architecture and Design
Arts
Business and Economics
Chemistry
Classical and Ancient Near Eastern Studies
Computer Sciences
Cultural Studies
Engineering
General Interest
Geosciences
History
Industrial Chemistry
Jewish Studies
Law
Library and Information Science, Book Studies
Life Sciences
Linguistics and Semiotics
Literary Studies
Materials Sciences
Mathematics
Medicine
Music
Pharmacy
Philosophy
Physics
Social Sciences
Sports and Recreation
Theology and Religion
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Cart
Home
Journals
Materials Science-Poland
Volume 36 (2018): Issue 4 (December 2018)
Open Access
Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations
Tomasz Kotwica
Tomasz Kotwica
,
Jaroslaw Domaradzki
Jaroslaw Domaradzki
,
Damian Wojcieszak
Damian Wojcieszak
,
Andrzej Sikora
Andrzej Sikora
,
Malgorzata Kot
Malgorzata Kot
and
Dieter Schmeisser
Dieter Schmeisser
| Feb 01, 2019
Materials Science-Poland
Volume 36 (2018): Issue 4 (December 2018)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Feb 01, 2019
Page range:
761 - 768
Received:
Nov 09, 2018
Accepted:
Nov 30, 2018
DOI:
https://doi.org/10.2478/msp-2018-0100
Keywords
surface
,
gradient distribution
,
thin film oxide
© 2018 Tomasz Kotwica et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.