Skip to content
Publish & Distribute
Publishing Solutions
Distribution Solutions
Library Services
Subjects
Architecture and Design
Arts
Business and Economics
Chemistry
Classical and Ancient Near Eastern Studies
Computer Sciences
Cultural Studies
Engineering
General Interest
Geosciences
History
Industrial Chemistry
Jewish Studies
Law
Library and Information Science, Book Studies
Life Sciences
Linguistics and Semiotics
Literary Studies
Materials Sciences
Mathematics
Medicine
Music
Pharmacy
Philosophy
Physics
Social Sciences
Sports and Recreation
Theology and Religion
Publications
Journals
Books
Proceedings
Publishers
Journal Matcher
Blog
Contact
Search
English
English
Deutsch
Polski
Español
Français
Italiano
Cart
Home
Journals
Materials Science-Poland
Volume 36 (2018): Issue 2 (June 2018)
Open Access
The influence of Kanthal wire surface defects on the formation of Si nanolayer deposited by PVD method
Mieczysław Szczypiński
Mieczysław Szczypiński
PPHU TERMEX sp. z o.o.,
Koszalin, Poland
Search for this author on
Sciendo
|
Google Scholar
Szczypiński, Mieczysław
,
Kazimierz Reszka
Kazimierz Reszka
Koszalin University of Technology, 75-453
Koszalin, Poland
Search for this author on
Sciendo
|
Google Scholar
Reszka, Kazimierz
and
Michał M. Szczypiński
Michał M. Szczypiński
Technical University of Liberec, 461 17
Liberec, Czech Republic
Search for this author on
Sciendo
|
Google Scholar
Szczypiński, Michał M.
Jun 25, 2018
Materials Science-Poland
Volume 36 (2018): Issue 2 (June 2018)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Download Cover
Published Online:
Jun 25, 2018
Page range:
264 - 269
Received:
Mar 18, 2017
Accepted:
Mar 15, 2018
DOI:
https://doi.org/10.1515/msp-2018-0038
Keywords
PVD
,
nanolayers
,
microwire
,
corrosion
,
EPS
© 2018 Mieczysław Szczypiński et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
