Studies on Inx(As2Se3)1-x thin films using variable angle spectroscopic ellipsometry (VASE)
Aug 30, 2016
About this article
Published Online: Aug 30, 2016
Page range: 501 - 507
Received: Oct 09, 2014
Accepted: Apr 29, 2015
DOI: https://doi.org/10.1515/msp-2015-0075
Keywords
© 2016
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Amin, G. A. M.