Studies on In_x(As₂Se₃)_1-x thin films using variable angle spectroscopic ellipsometry (VASE)

Publié en ligne: 30 août 2016

Pages: 501 - 507

Reçu: 09 oct. 2014

Accepté: 29 avr. 2015

DOI: https://doi.org/10.1515/msp-2015-0075

Mots clés

chalcogenides, ellipsometry, optical absorption, energy gap, nonlinear optics

© 2016

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.