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Joint Feature Selection and Classification for Positive Unlabelled Multi–Label Data Using Weighted Penalized Empirical Risk Minimization

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Towards Self-Healing Systems through Diagnostics, Fault-Tolerance and Design (Special section, pp. 171-269), Marcin Witczak and Ralf Stetter (Eds.)

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Paweł Teisseyre
Institute of Computer Science, Polish Academy of SciencesWarsaw, Poland
Faculty of Mathematics and Information Science, Warsaw University of TechnologyWarsaw, Poland
eISSN:
2083-8492
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Mathematics, Applied Mathematics