Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers

Data publikacji: 27 lis 2024

Otrzymano: 03 lip 2024

Przyjęty: 22 paź 2024

DOI: https://doi.org/10.2478/amns-2024-3506

Słowa kluczowe

Voltage transformer, Resonant CVT analysis, Low voltage test, Neural network, Error analysis

© 2024 Xu Chen et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.