Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers

Publicado en línea: 27 nov 2024

Recibido: 03 jul 2024

Aceptado: 22 oct 2024

DOI: https://doi.org/10.2478/amns-2024-3506

Palabras clave

Voltage transformer, Resonant CVT analysis, Low voltage test, Neural network, Error analysis

© 2024 Xu Chen et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.