Accès libre

Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique

Ijaz Ali

Ijaz Ali

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Ali, Ijaz
, 
Amjid Iqbal

Amjid Iqbal

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Iqbal, Amjid
, 
Arshad Mahmood

Arshad Mahmood

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Mahmood, Arshad
, 
A. Shah

A. Shah

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Shah, A.
, 
M. Zakria

M. Zakria

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Zakria, M.
 et 
Asad Ali

Asad Ali

Pakistan
Recherchez cet auteur sur
Sciendo|Google Scholar
Ali, Asad
  
19 déc. 2016
Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique's Cover Image
À propos de cet article
Article précédent
Article suivant
Citez
Télécharger la couverture
Publié en ligne: 19 déc. 2016
Pages: 828 - 833
Reçu: 16 avr. 2016
Accepté: 17 oct. 2016
DOI: https://doi.org/10.1515/msp-2016-0118
Mots clés
© Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Transmission spectra (a) and optical band energy (b) of as deposited and annealed Cd1−xZnxSe thin films.
Transmission spectra (a) and optical band energy (b) of as deposited and annealed Cd1−xZnxSe thin films.
Experimental and modeled values of ψ and Δ for Cd1−xZnxSe thin films annealed at 400 ΰC.
Experimental and modeled values of ψ and Δ for Cd1−xZnxSe thin films annealed at 400 ΰC.
Variation of optical constants (a) refractive index and (b) extinction coefficient in Cd1−xZnxSe thin films.
Variation of optical constants (a) refractive index and (b) extinction coefficient in Cd1−xZnxSe thin films.
The plot of (n2−1)−1 versus photon energy (hν)2 for as deposited and annealed Cd1−xZnxSe thin films.
The plot of (n2−1)−1 versus photon energy (hν)2 for as deposited and annealed Cd1−xZnxSe thin films.

Optical band gap and dispersion parameters for investigated thin films_

CompositionEg (eV)Eg (eV)Eo (eV)Eo (eV)Ed (eV)Ed (eV)Thickness (nm)Thickness (nm)
as depannealedas depannealedannealedannealedas depannealed
CdSe1.691.653.423.1919.3718.78180177
Cd:60Zn:40Se2.124.073.9620.8720.88158154
ZnSe2.572.54.854.5822.6722.47190179
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Sciences des matériaux, Sciences des matériaux, autres, Nanomatériaux, Matériaux fonctionnels et intelligents, Caractérisation et propriétés des matériaux
RSS Feed de la revue