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Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

Andrzej Sikora

Andrzej Sikora

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland
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Sikora, Andrzej
, 
Magdalena Moczała

Magdalena Moczała

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland
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Moczała, Magdalena
 and 
Bartosz Boharewicz

Bartosz Boharewicz

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland
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Boharewicz, Bartosz
  
Nov 02, 2018
Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration's Cover Image
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Published Online: Nov 02, 2018
Page range: 397 - 402
Received: Mar 27, 2017
Accepted: Jun 12, 2018
DOI: https://doi.org/10.2478/msp-2018-0071
Keywords
© 2018 Andrzej Sikora et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties
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