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Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures

Michał Piekarski

Michał Piekarski

  • AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
  • National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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Piekarski, Michał
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Joanna Jaworek-Korjakowska

Joanna Jaworek-Korjakowska

AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
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Jaworek-Korjakowska, Joanna
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Adriana Wawrzyniak

Adriana Wawrzyniak

National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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Wawrzyniak, Adriana
  
Mar 19, 2024
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Published Online: Mar 19, 2024
Page range: 139 - 156
Received: Jun 10, 2023
Accepted: Dec 13, 2023
DOI: https://doi.org/10.2478/jaiscr-2024-0008
Keywords
© 2024 Michał Piekarski et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Computer Sciences, Databases and Data Mining, Artificial Intelligence
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