Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures
Michał Piekarski
- AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
- National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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, Joanna Jaworek-Korjakowska
AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
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and Adriana Wawrzyniak
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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Mar 19, 2024
About this article
Published Online: Mar 19, 2024
Page range: 139 - 156
Received: Jun 10, 2023
Accepted: Dec 13, 2023
DOI: https://doi.org/10.2478/jaiscr-2024-0008
Keywords
© 2024 Michał Piekarski et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Piekarski, Michał
AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
Jaworek-Korjakowska, Joanna
AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
Wawrzyniak, Adriana
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland