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Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures

Michał Piekarski

Michał Piekarski

  • AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
  • National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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Piekarski, Michał
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Joanna Jaworek-Korjakowska

Joanna Jaworek-Korjakowska

AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
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Jaworek-Korjakowska, Joanna
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Adriana Wawrzyniak

Adriana Wawrzyniak

National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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Wawrzyniak, Adriana
  
19 mar 2024
Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures's Cover Image
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Pubblicato online: 19 mar 2024
Pagine: 139 - 156
Ricevuto: 10 giu 2023
Accettato: 13 dic 2023
DOI: https://doi.org/10.2478/jaiscr-2024-0008
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© 2024 Michał Piekarski et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Informatica, Base dati e data mining, Intelligenza artificiale
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