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Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

A.M. Abd-Elnaiem

A.M. Abd-Elnaiem

Physics Department, Faculty of Science, Assiut University,Assiut, Egypt
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Abd-Elnaiem, A.M.
, 
M. Mohamed

M. Mohamed

Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
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Mohamed, M.
, 
R.M. Hassan

R.M. Hassan

  • Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
  • Physics Department, Faculty of Education-Zingiber, Aden University,Aden, Yemen
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Hassan, R.M.
, 
M.A. Abdel-Rahim

M.A. Abdel-Rahim

Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
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Abdel-Rahim, M.A.
, 
A.A. Abu-Sehly

A.A. Abu-Sehly

Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
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Abu-Sehly, A.A.
 and 
M.M. Hafiz

M.M. Hafiz

Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
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Hafiz, M.M.
  
Jun 25, 2018
Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique's Cover Image
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Published Online: Jun 25, 2018
Page range: 193 - 202
Received: Dec 22, 2016
Accepted: Feb 13, 2018
DOI: https://doi.org/10.1515/msp-2018-0022
Keywords
© 2018 A.M. Abd-Elnaiem et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties
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