<abstract xmlns="http://www.w3.org/1999/xhtml"> Effect of annealing temperature on the structural and optical properties of As30Te60Ga10 thin film was studied using various techniques such as differential scanning calorimetry (DSC), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The DSC analysis revealed that the As30Te60Ga10 glass has a single glass transition and crystallization peak while XRD results confirmed that the as-prepared and annealed films have crystalline nature. The coexistence of the crystalline phases in the investigated films could be attributed to the formation of orthorhombic As, hexagonal Ga7Te10, and monoclinic As2Te3 phases. It was found that the average crystallite size and optical parameters of the studied films depend on the annealing temperature. For example, the optical band gap decreased from 1.54 eV to 1.11 eV as the annealing temperature increased from 300 K to 433 K.</abstract>

Effect of annealing temperature on the structural and optical properties of As30Te60Ga10 thin film was studied using various techniques such as differential scanning calorimetry (DSC), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The DSC analysis revealed that the As30Te60Ga10 glass has a single glass transition and crystallization peak while XRD results confirmed that the as-prepared and annealed films have crystalline nature. The coexistence of the crystalline phases in the investigated films could be attributed to the formation of orthorhombic As, hexagonal Ga7Te10, and monoclinic As2Te3 phases. It was found that the average crystallite size and optical parameters of the studied films depend on the annealing temperature. For example, the optical band gap decreased from 1.54 eV to 1.11 eV as the annealing temperature increased from 300 K to 433 K.

Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

Materials Science-Poland

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Structural and optical characterization of annealed AsTeGa thin films prepared by thermal evaporation technique

Effect of annealing temperature on the structural and optical properties of As30Te60Ga10 thin film was studied using various techniques such as differential...

Structural and optical characterization of annealed As₃₀Te₆₀Ga₁₀ thin films prepared by thermal evaporation technique

Publicado en línea: 25 jun 2018

Páginas: 193 - 202

Recibido: 22 dic 2016

Aceptado: 13 feb 2018

DOI: https://doi.org/10.1515/msp-2018-0022

Palabras clave
chalcogenide, As-Te-Ga, thin films, structural properties, optical properties, thermal evaporation

© 2018 A.M. Abd-Elnaiem et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

Publicado en línea: 25 jun 2018

Páginas: 193 - 202

Recibido: 22 dic 2016

Aceptado: 13 feb 2018

DOI: https://doi.org/10.1515/msp-2018-0022

Palabras clavechalcogenide, As-Te-Ga, thin films, structural properties, optical properties, thermal evaporation

© 2018 A.M. Abd-Elnaiem et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Structural and optical characterization of annealed As₃₀Te₆₀Ga₁₀ thin films prepared by thermal evaporation technique

Palabras clave
chalcogenide, As-Te-Ga, thin films, structural properties, optical properties, thermal evaporation