Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique
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Jun 25, 2018
About this article
Published Online: Jun 25, 2018
Page range: 193 - 202
Received: Dec 22, 2016
Accepted: Feb 13, 2018
DOI: https://doi.org/10.1515/msp-2018-0022
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© 2018 A.M. Abd-Elnaiem et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Abd-Elnaiem, A.M.
Physics Department, Faculty of Science, Assiut University,Assiut, Egypt
Mohamed, M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Hassan, R.M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,Aden, Yemen
Abdel-Rahim, M.A.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Abu-Sehly, A.A.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Hafiz, M.M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt