Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
Feb 18, 2017
About this article
Article Category: Expert Review
Published Online: Feb 18, 2017
Page range: 13 - 50
Received: Nov 23, 2016
Accepted: Dec 03, 2016
DOI: https://doi.org/10.1515/jdis-2017-0002
Keywords
© 2017 Anthony F.J. van Raan
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
van Raan, Anthony F.J.
Centre for Science and Technology Studies (CWTS), Leiden UniversityLeiden, The Netherlands