Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
18 feb 2017
INFORMAZIONI SU QUESTO ARTICOLO
Categoria dell'articolo: Expert Review
Pubblicato online: 18 feb 2017
Pagine: 13 - 50
Ricevuto: 23 nov 2016
Accettato: 03 dic 2016
DOI: https://doi.org/10.1515/jdis-2017-0002
Parole chiave
© 2017 Anthony F.J. van Raan
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
van Raan, Anthony F.J.
Centre for Science and Technology Studies (CWTS), Leiden UniversityLeiden, The Netherlands