Otwarty dostęp

Evaluation of AlGaN/GaN heterostructures properties by QMSA and AFM techniques


Zacytuj

Adam Szyszka
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego Street 11/17, 50-372, Wroclaw, Poland
Mateusz Wośko
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego Street 11/17, 50-372, Wroclaw, Poland
Bogdan Paszkiewicz
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego Street 11/17, 50-372, Wroclaw, Poland
Marek Tłaczała
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego Street 11/17, 50-372, Wroclaw, Poland
eISSN:
2083-124X
ISSN:
2083-1331
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties