Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations
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01 lut 2019
O artykule
Data publikacji: 01 lut 2019
Zakres stron: 761 - 768
Otrzymano: 09 lis 2018
Przyjęty: 30 lis 2018
DOI: https://doi.org/10.2478/msp-2018-0100
Słowa kluczowe
© 2018 Tomasz Kotwica et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Kotwica, Tomasz
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Domaradzki, Jaroslaw
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Wojcieszak, Damian
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Sikora, Andrzej
Department of Material Science and Diagnostics, Electrotechnical InstituteWroclaw, Poland
Kot, Malgorzata
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-SenftenbergCottbus, Germany
Schmeisser, Dieter
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-SenftenbergCottbus, Germany