Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations
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01. Feb. 2019
Über diesen Artikel
Online veröffentlicht: 01. Feb. 2019
Seitenbereich: 761 - 768
Eingereicht: 09. Nov. 2018
Akzeptiert: 30. Nov. 2018
DOI: https://doi.org/10.2478/msp-2018-0100
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© 2018 Tomasz Kotwica et al., published by Sciendo
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Kotwica, Tomasz
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Domaradzki, Jaroslaw
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Wojcieszak, Damian
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and TechnologyWroclaw, Poland
Sikora, Andrzej
Department of Material Science and Diagnostics, Electrotechnical InstituteWroclaw, Poland
Kot, Malgorzata
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-SenftenbergCottbus, Germany
Schmeisser, Dieter
Applied Physics-Sensor Technology, Brandenburg, University of Technology Cottbus-SenftenbergCottbus, Germany