Application of Digital Filters to Check Quality of the Automatically Scaled Ionograms

Data publikacji: 14 lip 2015

Zakres stron: 164 - 168

Otrzymano: 17 gru 2014

DOI: https://doi.org/10.2478/jee-2015-0026

Słowa kluczowe

ionogram, F2 layer, critical frequency, virtual height, total electron content, finite impulse response filter

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.