Application of Digital Filters to Check Quality of the Automatically Scaled Ionograms

Publié en ligne: 14 juil. 2015

Pages: 164 - 168

Reçu: 17 déc. 2014

DOI: https://doi.org/10.2478/jee-2015-0026

Mots clés

ionogram, F2 layer, critical frequency, virtual height, total electron content, finite impulse response filter

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

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