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Journals
Journal of Electrical Engineering
Volume 66 (2015): Issue 3 (May 2015)
Open Access
Application of Digital Filters to Check Quality of the Automatically Scaled Ionograms
Luboš Rejfek
Luboš Rejfek
,
Zbyšek Mošna
Zbyšek Mošna
,
Daniel Kouba
Daniel Kouba
,
Josef Boška
Josef Boška
and
Dalia Burešová
Dalia Burešová
| Jul 14, 2015
Journal of Electrical Engineering
Volume 66 (2015): Issue 3 (May 2015)
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Published Online:
Jul 14, 2015
Page range:
164 - 168
Received:
Dec 17, 2014
DOI:
https://doi.org/10.2478/jee-2015-0026
Keywords
ionogram
,
F2 layer
,
critical frequency
,
virtual height
,
total electron content
,
finite impulse response filter
© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.