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The Fast Method for Correction of Distortion on Infrared Marker-Based Tracking System

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20 lut 2013

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Wang, Haibin
Institute Microelectronics of Chinese Academy of SciencesChina
Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
He, Qing
Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
Guan, Guan
Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
Leng, Bin
Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
Zeng, Dewen
Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
Język:
Angielski
Częstotliwość wydawania:
1 razy w roku
Dziedziny czasopisma:
Inżynieria, Wstępy i przeglądy, Inżynieria, inne