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Revisiting Strategies for Fitting Logistic Regression for Positive and Unlabeled Data

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Towards Self-Healing Systems through Diagnostics, Fault-Tolerance and Design (Special section, pp. 171-269), Marcin Witczak and Ralf Stetter (Eds.)
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Cita

eISSN:
2083-8492
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Mathematics, Applied Mathematics