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XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Technical Manual V. 1.1 b. Stresstech Oy., 2007.Search in Google Scholar

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Software User's Guide X3000 V. 1.22d. Stresstech Oy., 2007.Search in Google Scholar

M.E. Fitzpatric, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton, L. Suominen, "Determination of Residual Stresses by X-Ray Diffraction - Issue 2", A National Measurement Good Practice Guide No.52, National Physical Laboratory, 2005.Search in Google Scholar

ISSN:
2081-7738
Lingua:
Inglese
Frequenza di pubblicazione:
Volume Open
Argomenti della rivista:
Engineering, Introductions and Overviews, other