Cite

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Technical Manual V. 1.1 b. Stresstech Oy., 2007.Search in Google Scholar

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Software User's Guide X3000 V. 1.22d. Stresstech Oy., 2007.Search in Google Scholar

M.E. Fitzpatric, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton, L. Suominen, "Determination of Residual Stresses by X-Ray Diffraction - Issue 2", A National Measurement Good Practice Guide No.52, National Physical Laboratory, 2005.Search in Google Scholar

ISSN:
2081-7738
Idioma:
Inglés
Calendario de la edición:
Volume Open
Temas de la revista:
Engineering, Introductions and Overviews, other