À propos de cet article

Citez

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Technical Manual V. 1.1 b. Stresstech Oy., 2007.Search in Google Scholar

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Software User's Guide X3000 V. 1.22d. Stresstech Oy., 2007.Search in Google Scholar

M.E. Fitzpatric, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton, L. Suominen, "Determination of Residual Stresses by X-Ray Diffraction - Issue 2", A National Measurement Good Practice Guide No.52, National Physical Laboratory, 2005.Search in Google Scholar

ISSN:
2081-7738
Langue:
Anglais
Périodicité:
Volume Open
Sujets de la revue:
Engineering, Introductions and Overviews, other